Redundancy Based Design and Analysis of ALU Circuit Using CMOS 180nm Process Technology for Fault Tolerant Computing Architectures
نویسندگان
چکیده
منابع مشابه
Redundancy Based Design and Analysis of ALU Circuit Using CMOS 180nm Process Technology for Fault Tolerant Computing Architectures
As the technology entering into Nano dimensions, the manufacturing processes are becoming less reliable, that is drastically impacting the yield. Therefore, fault tolerant systems are becoming more important, particularly in safety-critical applications. In this paper, we present the design and analysis of 4-bit Arithmetic and Logical Unit (ALU) circuit designed using CMOS 180 nm process techno...
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ژورنال
عنوان ژورنال: International Journal of Computing and Digital Systems
سال: 2015
ISSN: 2210-142X
DOI: 10.12785/ijcds/040106